CRC-based SEU Reinforcement Design Of SRAM-type Chip In Aircraft

Nowadays, the chip based on static random access memory(SRAM) in aircraft has become the indispensable part in avionic equipment. However, the SRAM type memory cell can be affected by single event upset(SEU). In recent years, with the volume of chip gets smaller and the memory space gets larger, the chips based SRAM are more and more sensitive to single event upset. Therefore, reducing the sensitivity of SEU in key avionics system by means of combining soft and hard hardware technologies plays crucial role to the safety of the airplane.Through the requirements of the detection and reinforcement of the single event upset in avionics, this paper designed system include failure detection to SEU in SRAM memory cell, reinforced circuit and fault injection. For transmission system based on SRAM-type storage unit, reinforced circuit designed adopts arithmetic of cyclic redundancy check(CRC). Moreover, it simulated influence of SEU to SRAM memory cell by means of fault injection. During the test, traversal test towards all memory cells in memory chip was conducted. Whether fault can be detected and corrected automatically would be determined and the addresses of storage cell which is sensitive to SEU were recorded.The test results show that the circuit that is designed could detect and correct the fault that caused by SEU, and report the fault that caused by multi-digit flip. After analyzing the resulted data, it is indicated that this reinforce design could increase the performance that resists SEU in SRAM memory cell. This study aims to ensure the reliability of avionic equipment, as well as reduced the potential risk and loss to minimum. This design provides a convenient and effective approach to protect the airborne system from the effect of single event upset.