The Control Procedure Of Intelligent System For Detecting Hysteresis Loop Based On Microcontroller

In recent years,with the rapid development of the times and the rapid progress of science and technology,scientific researcher working on the magnetic material hysteresis phenomenon has not stopped,and achieved large progress and development,but because of hysteresis is extremely Complex,so far no boby could give it a satisfied approach to do it.And the study of hysteresis is an important part of the study of magnetic materials hysteresis loop.The hysteresis loop is one of the most important and essential magnetic parameters of the magnetic material.It shows a closed curve in the H-B plane coordinate system.Different ferromagnetic properties correspond to different hysteresis loops.at the same time,materials having the different hysteresis loop will have different applications.now,ferromagnetic materials as the main building materials is particularly important for social progress and economic development,and the magnetic properties is an important parameter of ferromagnetic materials.Therefore,it is of great research value to design an intelligent system for testing the hysteresis loop of ferromagnetic material.The high-speed,real-time,convenient,fast,intelligent design is the main task and objectives of the intelligent measurement system.Based on the above premise,we designed a smart hysteresis loop measurement system based on the overall control system,D / A signal control system,A / D signal acquisition system,LabVIEW PC data processing part and the corresponding hardware processing circuit and software control,acquisition,transmission program.The system has been basically tested to achieve the requirements of high-speed,intelligent and accurate.This paper briefly introduces the main components of the measurement system,the principle and the hardware circuit.And it mainly introduces the program control for the whole system including the total control system program of the MCU,the D / A signal control program,the A / D signal acquisition program,the communication program between the MCU and the PC,and the chip selection of each part.The entire intelligent test system is formed by the control of the software program,combined with the hardware circuit and LabVIEW reasonable data processing.The control program which is a very important part is the neural control center of the measurement system.