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The Research On Productive Quality Management Improvement Of Y Semiconductor Corporation

Posted on:2016-03-28Degree:MasterType:Thesis
Country:ChinaCandidate:W LiFull Text:PDF
GTID:2349330482966709Subject:Business administration
Abstract/Summary:PDF Full Text Request
With the competition among enterprises, the quality of the business is becoming more and more important.to improve product quality, enterprises'competitiveness are enhance which make enterprises in an advantageous position in international competition. The semiconductor industry is capital-intensive and technology-intensive. It's hard for company to enter the semiconductor industry, due to the machine is expensive, the process is complex. Chinese mainland import semiconductor industry chain in a large range when enter the 21st century. The development of industry is becoming mature, and many issues of quality are generated after years of rapid growth.This article describes the tools and methods of quality and quality control theory,then analyzes the problem of semiconductor manufacturing industry, quality control system, development of quality management. Y semiconductor manufacturing company's quality control issues are discussed in detail. Based on quality control methods, defect management as well as statistical process control need to be improved:The establishment of an effective quality management organizational model; establish reasonable production resource planning configuration management structure; promoting collaborative quality management system; The build quality problems database of knowledge; noting that the current statistical process control problems proposed combining process automatic control system solutions. And propose solutions of binding process automatic control system.This article is about lead frame manufacturing enterprises quality management optimization research paper, and measures for improvement of the research methods, for other similar enterprises also have some reference value.
Keywords/Search Tags:Semiconductors, quality control, statistical process control, zero defect management
PDF Full Text Request
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