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Research On Key Technologies In Low Light Sight Detection Equipment

Posted on:2019-02-24Degree:MasterType:Thesis
Country:ChinaCandidate:Q SunFull Text:PDF
GTID:2382330563499119Subject:Control Science and Engineering
Abstract/Summary:PDF Full Text Request
The level of science and technology is not only the main symbol to measure the degree of national defense modernization,but also an important factor that affects the combat effectiveness of the military.In the face of all-weather three-dimensional combat demand,Low-Level-Light?LLL?sights equipment has become the main equipment for the nights fighting.Therefore,it is of great significance to detect and evaluate such equipment before it is put into use.LLL sights detector consists of temperature stress source,low light stress source,vibration stress source,electrical stress source and so on.The LLL stress source is a simulated night light environment for the detection of LLL sight.Electrical stress source simulates the power supply of the LLL sights power supply in different environments.In this paper,the two key technologies of low light stress and electrical stress in the detection equipment are studied.The light stress source study simulates the nighttime light environment under different conditions.The calibration of illuminance parameters is determined by analyzing the luminous environment at night.Use appropriate driver circuit to drive light source.The photoelectric conversion circuit is used to detect the light intensity,and the FPGA is used to control the switching of different light illumination.The electrical stress system mainly uses FPGA as the control core and designs the voltage control circuit.The output voltage is sent to the FPGA through the acquisition circuit,and then an automatic closed-loop voltage regulation is achieved by using the digital filter and integral separate PID control algorithm.In the past,the low light stress source system and the electric stress source system are separately controlled.This paper innovatively realizes the centralized control of low light stress source and electric stress source through FPGA programming,and improves the stability and integration of the system.The experimental results show that the system can provide four kinds of low light level with illumination of1×10-1lx±10%,1×10-2lx±10%,1×10-3lx±10%and1×10-4lx±10%.Four LLL environments can realize free switching.The output voltage of the four-way electrical stress can be adjusted within the range of 1-24V with a resolution of25mV;output current?1A;ripple voltage<3mV.Satisfies the criteria for the detection of low light sights,and the system has good accuracy and stability.
Keywords/Search Tags:Low-Level-Light sights, Light stress source, Electrical stress source, Integral sphere, Voltage control, FPGA
PDF Full Text Request
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