Research On Measurement System Of Film Sample Thickness Uniformity

The thickness of the film product and its thickness uniformity are one of the important factors affecting the quality of the product.In recent years,the method research and engineering realization of film thickness measurement have become more and more mature,but there are few studies on the measurement of film sample thickness uniformity.In view of this,this paper studies the thickness uniformity measurement of film samples.In this paper,the requirements of the film thickness uniformity measurement system are analyzed firstly,and the overall design scheme of the measurement system using the differential laser reflection measurement method and PLC as the core control unit is proposed.The measurement error of vibration generated in the paper is analyzed by pre-experimental method in this paper.The digital filtering algorithm is designed and verified by the analysis.The compensation scheme of thickness measurement under film wrinkle condition is studied.According to the design requirements of the system function,the mechanical structure and control system of the thickness measurement bench were designed.In this paper,the PLC program of system operation is designed.The motor motion control is carried out by pulse output.The sensor data is collected and processed by continuous handshake.The high-speed counter is used to match the sensor data with the two-dimensional plane coordinates.And the workflow of the self-calibration mode and the measurement mode is realized.The communication protocol between the upper computer and the lower computer is designed and serial communication is realized.This paper designs the host computer software of this sysytem based on Labview,realizes parameter configuration and business process through serial port command transmission,receives and parses the serial port data,clarifies the current working state of the system,and draws a three-dimensional image of film thickness uniformity.Data and images are saved using file management functions.The host computer program achieves good interpersonal interaction.After design and debugging,the measuring system realizes the functions of film thickness uniformity measurement,meets the design precision requirements,and can be used to detect the surface thickness uniformity of non-transparent film samples.