Research On Microwave Switch Rapid Test Technology

In today’s world,with the rapid development of science and technology,industrial production technology is also constantly updated,and manufacturers are constantly pursuing the miniaturization and portability of products.In this context,this paper proposes a rapid test method for microwave active devices,which USES microwave switch chip as the background to quickly and accurately extract its characteristic parameters.In this paper,in the frequency range of 10MHz~10GHz,rapid multiple tests are carried out on the microwave switch chip,and the test data is de-embedded to reduce errors and compared with the official data to determine the accuracy of the whole system.Firstly,by collecting and consulting relevant literatures,this paper briefly introduces the test instruments and some existing calibration techniques,and proposes methods that can be used to test active devices.At the same time,the microwave switch matrix is simply introduced.Secondly,the basic principle of transmission line and microwave network theory are introduced and deduced in detail,and the error model of vector network analyzer is deduced and analyzed based on the error of vector network analyzer.Thirdly,an equivalent circuit that can be used for rapid test is designed by HFSS simulation software.Meanwhile,the brackets and calibration pieces required by the whole system are also designed and verified.A set of microwave switch matrix is developed to convert the two-port output of the vector network analyzer into a three-port controllable output,which is convenient and fast for testing.Write a set of rapid test software,and constitute a complete rapid test system.Fourthly,the error which can’t be solved only by calibration is deduced and analyzed in detail,and the solution is put forward.Finally,several kinds of microwave switch chips are tested quickly,and the parameters are compared with the official data after data processing,and the errors are analyzed.In this paper,fast extraction of insertion loss and isolation degree can be achieved in the frequency band with the highest frequency of 10 GHz and the lowest frequency of 100 MHz,with an error of 6% and repeated test error of 2%.