Research And Development Of X-ray Single Crystal Material Detector And Its Quality Evaluation Method

With the rapid development of electronic information and other industries,single crystal materials have been widely used in aerospace,military sensing,precision apparatus,LED and other fields by virtue of its excellent optical,mechanical,electrical,dielectric and chemical stability.In the process of producing single crystal materials,quality evaluation is a key process.Current nondestructive methods are mainly based on X-ray diffraction method,the high cost and low efficiency,and based on X-ray orientation methods are relatively common,can achieve rapid assessment.The curve is analyzed and calculated,and it is artificially evaluated according to the relevant parameters,and it is only the quality assessment of the current single point of the test.Except for the expert experience,there is currently no feasible scientific scheme for the comprehensive quality evaluation method of the whole plane of the single crystal material,single crystal.The problem of comprehensive quality assessment of materials needs to be solved urgently,so it is particularly important to study methods that can solve this problem and design complete inspection equipment.In this paper,the complete equipment design scheme is given.The equipment is modified based on X-ray orientation instrument.The control system scheme of the slave machine and the host computer is designed and implemented.The slave machine with DSP as the control core mainly drives the underlying hardware system.And the control and data collection work,relying on the host computer software of the industrial computer is the core of the whole equipment,mainly responsible for human-computer interaction,algorithm landing and function realization tasks.In addition to the design scheme,this paper completed the complete hardware and software of the control system of the implementation of the work.The study of quality assessment method is an important work in this paper.Taking sapphire single crystal as an example,this paper proposes a single point quality assessment method,and further studies the comprehensive quality assessment method based on multi-point detection.In the single-point quality assessment method,the extraction strategy proposed in this paper can express the whole rocking curve with a set of feature vectors,construct a sample library,and apply the fuzzy-transfer closure clustering algorithm for cluster analysis.The problem of unsatisfactory application effect is analyzed and the method improvement is completed.The actual engineering application proves that the improved method has good performance on the single point quality assessment problem.In the problem of comprehensive quality assessment of single crystal materials,there are uncertain coupling relationships between the quality assessment results of multiple detection points,and there is an unknown,high-dimensional and complex nonlinear relationship with the comprehensive quality assessment results.In the problem of comprehensive quality assessment of single crystal materials,there are uncertain coupling relationships between the quality assessment results of multiple detection points,and there is an unknown,high-dimensional and complex nonlinear relationship with the comprehensive quality assessment results,so neural network technology is a potential choice.In this paper,the random vector function-link network method is used as the research starting point.According to the numerical simulation experiment and the practical application results,the problem is continuously analyzed and solved.By introducing the interval theory and adding the idea of cross-layer connection,the optimization iteration is carried out from the strategy and method.A comprehensive quality evaluation method for single crystal materials with good performance was designed to complete the design and implementation of the entire system.