Research On Defect Detection Technology Of Solar Panel Under High Illumination Based On InGaAs Camera

With the large-scale popularization of solar applications,the production capacity of solar panels continues to increase.Defect detection technology is the key to ensuring product quality.However,the existing defect detection technology can only work in a dark room,which results in a huge volume of the detection instrument and severely restricted detection environment.Therefore,manufacturers urgently need a defect detection technology that can adapt to various light environments to improve detection efficiency and reduce detection costs.To this end,this subject has carried out in-depth research on defect detection technology under strong light of solar panels.This article first briefly introduces the development status of solar panel inspection technology.Aiming at the problem that the existing detection technology can only work in a dark environment,a solution that can detect defects in solar panels under high illumination conditions is proposed.In view of the low quantum efficiency of mature CMOS or CCD industrial cameras in the near-infrared band,a set of InGaAs-based near-infrared imaging system was designed.The hardware part mainly includes detector peripheral circuit,operational amplifier and AD circuit,display output circuit,FPGA daughter card.It can realize the drive control of the detector,and output images in two ways: HDMI and Camera Link.The logic design part mainly includes detector drive module,data receiving module,data buffer module,HDMI display part,Camera Link display part.In addition,a variety of image processing algorithms have been added for image quality issues.Including adaptive dynamic piecewise linear stretching algorithm,ping-pong operation algorithm,blind element replacement algorithm,single-point correction algorithm.Finally,an experimental platform for solar panel defect detection was built.In different lighting environments,a large number of testing experiments are carried out on the solar panel samples to be tested.Through the defect extraction algorithm,the near-infrared image sequence transmitted by Camera Link is processed on the Matlab platform to achieve the purpose of removing the background and extracting the defect image of the solar panel.When the illuminance is lower than 28600 lx,the defect shape,type,area and relative depth can be clearly distinguished from the inspection results.The results show that the detection scheme can avoid the interference of sunlight,realize defect detection of solar panels under high illumination conditions,and has many advantages such as high efficiency,accuracy and strong adaptability.