A Research On General Automated Test Platform For Internal Resources Of Xilinx FPGA

With the rapid development of integrated circuit design and semiconductor technology,the complexity and integration of FPGA structure are increasing,and the testing problems for FPGA are becoming increasingly acute,which has become an important factor restricting the development of FPGA in addition to cost,power consumption and performance.Although the current popular test methods have inherent advantages,they also have obvious disadvantages.For example,the test method based on ATE(Automatic Test Equipment)is expensive and the configuration is time-consuming and laborious,and the test based on BIST(Built-in Self-Test)requires multiple times.The configuration and versatility are not strong,and the test method based on boundary scan is inefficient and limited by the chip pins.Based on the above reasons,it is extremely important to develop a test method that can improve or complement the shortcomings of mainstream FPGA test methods.The research purpose of this paper is to develop a universal automated test platform for Xilinx 7 series FPGA internal resources based on the existing technology in the laboratory,which can have a good balance of test cost,test efficiency,fault location and implementation difficulty.Thereby promoting the development of FPGA test technology to a certain extent.The main research contents of this paper are as follows:(1)Through the in-depth study of Xilinx’s 7 series FPGA related documents,the theoretical basis of the FPGA test platform is systematically studied,including the circuit structure and control method of boundary scan technology,as well as the working principle,data format and work of bit stream readback technology Process etc.(2)In order to better complete the design of the test platform,the system learned about the internal structure and resource form of Xilinx 7 series FPGAs,and after in-depth study of 7 series FPGA related technical documents,the independent design was completed based on the XC7A100 T in Artix-7 The FPGA hardware test board has passed the test to provide the correct hardware foundation for the test platform.(3)With the support of a large number of theoretical foundations,an FPGA test platform based on boundary scan and bitstream readback technology was designed and completed,and the test platform was applied to the FPGA hardware test board for related tests.The experimental results show that the FPGA test The platform can obtain the correct test response from the IO pins through boundary scan,and also obtain the status of FPGA internal registers through bitstream readback,and complete the analysis of readback data,and finally pass the analysis results and fault diagnosis list Comparison.The test results prove that the FPGA test platform can be used to test the internal resources of the FPGA and accurately locate faults.