| This paper is a systematic study of E-fuse element and the related periphery circuit. Through a series of testing on E-fuse elements with different properties, the easily programmed E-fuse element with good reliability and stability is selected. With an optimized program and sense circuit, the E-fuse element is easy programmed with a normal I/O voltage within an accepted timeframe. Programmed E-fuse and un-programmed E-fuse elements can be differentiated by the simple sense circuit. |
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