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Foreign Patents To Speed Up The Review Mechanism And Its Reference To China

Posted on:2011-11-21Degree:MasterType:Thesis
Country:ChinaCandidate:Y X HeFull Text:PDF
GTID:2199330332971866Subject:Civil and Commercial Law
Abstract/Summary:PDF Full Text Request
The system of patent accelerated examination is vital not only to applicants, but also to patent offices. At present, patent offices of the USA, Japan, Europe and South Korea have already developed more comprehensive laws and regulations and some incentive policies, which have some effects in guaranteeing applicant's getting patent rights fast. At the same time, the above offices are actively carrying out international cooperation such as"Patent Prosecution Highway"in order to help their applicants to get patent rights overseas fast and to help lightening the pressure of patent examination.China has not yet put the detailed provision of accelerated examination in the patent laws and regulations. However, we have corresponding system, which help applicants in some certain. However, the system has some problems in its implementation and effects. Besides, there are some limits in our cooperation with other patent offices. Applicants can not get patent rights overseas fast through present system. So it is of value to study how to improve our acceleration system and help applicants to get rights fast. According to the description mentioned above, this dissertation will do some analyses in regard to patent accelerated examination.The dissertation contains four parts. The first part mainly introduces the conception, trait and function of accelerated examination. The second mainly focuses on the accelerated examination systems of some developed countries. The third part is about the latest development of global patent accelerated examination, Patent Prosecution Highway. The last part mainly tends to make several suggestions to the improvement of China's system of patent accelerated examination.
Keywords/Search Tags:patent, system of accelerated examination, patent pendency, patent examination ability
PDF Full Text Request
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