Exploration And Analysis Of Electronic Detection Of Raw Silk's Flatness

Electronic detection has been recently more and more important in research of raw silk's detection. And research on raw silk's cross section is one of the most important aspects in all of the detection. Recently, there are research of fineness and evenness in raw silk's electronic detection. But research on raw silk's flatness has been still based on slice method. Therefore, in order to improve its detection efficiency and help the analysis of raw silk's cross section, this paper mainly researches on electronic detection of raw silk's flatness based on the theory of measurement of two- direction raw silk's diameter.The summarized way of electronic detection of raw silk's flatness in this paper is: use two photoelectric sensors to detect raw silk's diameter, finish data acquisition through DAQ system, achieve program design and conduct data processing and analysis based on LabVIEW, and finally realize detection and analysis of raw silk's flatness. For study the effect of flatness on other parameters of raw silk's cross section, evenness (%) is also computed in this paper, and then discussion on relation of raw silk's flatness and evenness. In addition, raw silk's evenness of different cut-off length is compared on this detection system.Detection indicates that this electronic method is more convenient than prior measurement method of raw silk's flatness. Electronic detection of raw silk's cross section is richer with this detection method. And some reference value to research on other flat fiber and irregular cross-section fiber is provided by this detection method.