Space applications have been seeing more and more CMOS integrated circuits as the manufacturing process and design level is getting more and more advanced. However, the physical characteristics of CMOS-based integrated circuits make it subjective to radiation environment in space. Therefore the anti-radiation techniques of CMOS integrated circuits have been in research long before and many researchers focus on the verification and measurement of CMOS integrated circuits under radiation condition.This thesis proposed a low cost measurement system for remote real-time monitor of radiation effects of CMOS integrated circuits, which is based on virtual instrument technology. The measurement system combined the advantages of domestic on-line and off-line test and has successfully been applied to the total ionizing dose and single event effect tests of a CMOS digital-analog converter circuit for several times, during which full-process and full-parameter on-line monitor was achieved. The test results and analysis of the measurement system are elaborated in the last part. This thesis is meant to provide a general thought on the full-process and full-parameter on-line monitor of radiation test of 10,000 gates scaled CMOS integrated circuits. |