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Research On The Evaluation Of Patent Efficiency And Quality

Posted on:2021-04-11Degree:DoctorType:Dissertation
Country:ChinaCandidate:Z R LiFull Text:PDF
GTID:1489306722958069Subject:Management Science and Engineering
Abstract/Summary:PDF Full Text Request
Patent efficiency and quality determine the competitive advantages in the development of innovative nations and innovative enterprises.Therefore,high-quality patents serve as a vital carrier of a nation's innovation in science and technology as well as its economic development.After the Covid-19 epidemic era,economic transformation and development from extensive to fine,highquality evolution is more important.China has entered a period of coexistence of internal and external cycles,economic driven from elements to innovation and improving the efficiency and quality of knowledge economy is the inevitable requirement of high quality economic and social development.Patent is an important embodiment of knowledge economy,and its efficiency and quality are important indexes to measure the core competitiveness of enterprises and the comprehensive strength of industries.Patent efficiency involves many subjects and links,which is closely related to patent quality.Improving the overall patent transformation and use efficiency will inevitably involve the comprehensive evaluation of patent efficiency and patent quality.However,the existing studies take patent efficiency and patent quality as two independent dimensions,focusing on the evaluation index system and evaluation factor selection of patent efficiency and patent quality,and lack of in-depth analysis and comprehensive evaluation of the relationship between the two.The main purpose of this study is to focus on the breakthrough point and unique perspective of high-tech industry on the basis of the existing independent patent efficiency and patent quality evaluation,and to use mathematical model to analyze patent efficiency and patent quality from qualitative and quantitative aspects.In order to improve patent efficiency and patent quality to give corresponding countermeasures.The main contents of this study include: from the patent efficiency,patent quality,interrelation,related concepts and other dimensions,the literature and theoretical analysis of related research at home and abroad;from the patent efficiency and patent quality two aspects of the discussion of its constituent elements,evaluation indicators and evaluation methods;take high-tech industry as an example,using the DEA model to carry out static and dynamic analysis of patent efficiency in China,build a comprehensive feature index of patent quality evaluation,analyze the quantitative relationship between patent quality and patent efficiency,establish a patent quality FMEA failure control module;On the basis of the summary of the whole research,the relevant management improvement suggestions are put forward.This study has made the key innovation in the comprehensive research of patent efficiency and patent quality,which includes both macro industrial efficiency analysis and micro patent quality control discussion.The macro management and micro adoption of patent are well combined.The main innovations are as follows:First,based on the deep analysis of the constituent elements of patent efficiency,the paper evaluates the static efficiency and dynamic efficiency of patent output from the macro perspective of industry;Second,based on the in-depth analysis of the constituent elements of patent quality and the impact of patent quality on patent suppliers,the comprehensive characteristic index of patent quality evaluation is constructed;Third,the patent quality failure control module is constructed by using quality control;Fourth,the comprehensive evaluation model of patent efficiency and patent quality is constructed,which reveals the complementary relationship between patent efficiency and patent quality.
Keywords/Search Tags:patent efficiency, patent quality, data envelopment analysis(DEA), failure model and effect analysis(FMEA), quality control
PDF Full Text Request
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