The Research And Application Of The Microwave High Power Automatic Test System Based On The Load/Source Pull

With the rapid development of the semiconductor devices, the measurement and testing of the semiconductor devices play an important role in the researching and applied field. The devices produced through all kinds of techniques are finally to be proved their ability by the testing of the device parameters. In the applied field of the devices, it is important to provide the characteristic parameters for the design of the circuit, for making sure the circuit structure and debugging it. The microwave high power automatic test system based on load/source pull is capable of making user set the known load/source impedance on device under test under actual operation condition. Then the various changes of device parameters and the optimal value can be found.The work in the thesis focuses on the research and the application of the test system. The research of the tuner, which is the core part of the system, is extended. It included the effect of the slide block structure to the reflectance and using two different slide blocks to extend the testing band. The thesis first introduced the importance of the load pull and the necessary of researching for the microwave large power automatic test system. Then, it introduced the building of the test system, calibration software of the automatic tuner and the testing software of the system. The thesis finally introduced the effective application. It is mainly applied for the power device parameters, such as the input and output impedance, IMD, power gain. Additionally, it extended the application to the frequency pull of the oscillators.This project was cooperated with CETC 41.It has passed the expert check on December 4th, 2006. But it still has some shortcoming such as the testing software.