Improvement Of Noise Testing Software Based On Virtual Instrumentation And Development Of Electrical Parameter Testing System

The electrical parameters and interior noise, especially low-frequency noise are key guide lines restricting the performance, sensitivity and the accuracy of electronic devices including semiconductor components and integrated circuits. They are also sensitive parameters denoting the quality and reliability information of the devices. Testing and analyzing of interior noise and electrical parameters are of great significance in engineering practices.The method we use to build up the electronic devices testing system in this paper is a way based on the idea of virtual instrumentation, in which a computer is taken as a primary part. This system has many advantages, such as a higher ratio of performance to price, a wider cover of function and a better upgrading capability. According to the practical testing requirements of noise and electrical parameters in our Lab, the new noise testing software system is built up based on the old one, and an electrical parameter testing and analyzing system of electronic devices based on the idea of virtual instrumentation is developed. Valuable results are obtained in this paper, such as follows:1. The reason for which the noise signals could not be sampled continuously is found out. The new noise testing software system based on the latest driver of the DAQ card can sample the noise signals continuously, and therefore, the correctness of the noise signals is guaranteed.2. The function of hardware-protecting and software-filtering are attached to the new designed noise testing system. The computer's resources are used more efficiently in the improved system.3. We conduct control upon the two pieces of apparatus, which are 238 Source-Measure-Unit and lps304 Linear Power Supply respectively, through GPIB and RS-232 bus on a computer platform. We perform measurements and analysis of the electrical parameters of a variety of electronic devices such as diodes, transistors, and FETs according to the current practical requirements of measurement in this research domain.4. The results of the measurements are compared between the self-designed system and those of the commonly used apparatus. It shows that the performance of the former...