Design & Realization Of Testing System For Intel80C31 Radiation Effect

The microprocessor has already been used in great quantities of various satellite's control system. It is called the core part. Because there are many high-energy protons and heavy-ions in the astrospace, they can make the super large scale integration of satellite like CPU,the memory take place single event effects, latchup or hard damage and directly shorten the satellite's work life. Therefore, it's very necessary to carry on the corresponding simulation experiments on the ground, aiming at the easily broken-down part, realize the reinforce and error-tolerance of components and the whole circuit.Intel80C31 is the main controller in the aerospace machine's electronics system, which easily has the phenomenon of Single Event Upset (SEU), Single Event Latchup (SEL) , Single Event Burnout and Single Event Gate Rupture because of the space radiation effect.Aiming at the simulation research on 80C31 CPU's damage brought on single event effects, the test system's hardware includes tested chip 80C31 CPU system, monitor control CPU system, host monitor computer system etc. The tested 80C31 CPU and 27C64 constitute a minimum system, which realizes data exchange to the monitor CPU through a dual-port RAM. Monitor CPU carries out data communication between the host computer through a RS-422 port. The tested 80C31's power current is monitored by hardware circuit. Test system's software is formed of three parts: the tested 80C31 CPU's test program; monitor AT89C52's communication, data exchange, detection program; host computer's monitor program.Making use of "the Intel80C31 radiation effect test system", many experiments about single event on Intel80C31 at the simulation test sub-system of laser single event effects have been done. Through checking 80C31 CPU's chip current, cutting power protection solves the damage problem of 80C31 CPU chip in the experiment on 80C31. This system facilitates the experiment process of research on Intel80C31 radiation effect greatly. It is an effective platform of research on Intel80C31 radiation effect. In addition, the platform can easily carry through related experiments on Intel80C31 radiation effect, capture the original data in the process of Intel80C31 radiation effect research, provide important foundation for the reinforce and error-tolerance of components and the whole circuits.