With the rapid progress of science and technology,the functional structure of electronic equipment is becoming more and more complicated,and there are more and more types of models.In order to ensure the safety and reliability of electronic equipment and meet the ever-increasing test requirements,automatic test systems have become an important means of reliable testing and maintenance of multiple models of complex electronic equipment and systems.The traditional automatic test system has the problems of strong specificity,incompatibility between test systems,poor interoperability,and low utilization rate.Designing and developing a test system with certain universality has become the future development direction.At present,the Automatic Test Markup Language(ATML)standard in the testing field provides the structure and details of the exchange and sharing of test information for automatic test systems.It has become an important part of the next-generation automatic test system.The standard is based on the extensible markup language to standardize the information exchanged and shared in the test execution of the automatic test system,and related technologies based on ATML have become an effective method for building a new generalized automatic test system.In order to effectively solve the problems of poor generality and poor information interaction of a certain type of electronic equipment test system,make full use of the advantages of ATML in the configuration of test information resources and information sharing.This article first analyzes and studies the structural composition of the ATML system and the relationship between each component standard in the design,development,and execution of the automatic test system.Then,the structure of the test description,instrument description and other components in the standard and the description method of the necessary information are studied,and the description content of the redundant test information is simplified under the premise of meeting the ATML standard,which lays a theoretical foundation for the further study of the model establishment and system application of ATML in a certain type of electronic equipment testing.Secondly,study on the key technology of ATML standard applied in automatic test system.By Comparing the two parsing methods of ATML test description file,and use the DOM tree-based parsing technology method and extract the test information to meet the shared transmission of test information in the automatic test system;Study how to use the test information and test resource information in the ATML test subject to achieve the matching of test requirements and test resources and the verification of the full test capability of the system,and according to the detailed test information in the Test Description file,the technical method of how to execute the corresponding test process and steps was studied.Then,according to the test requirements of a certain type of electronic equipment,the system functional modules and BIT design are analyzed,and specific test items are designed and their test methods are studied,and a test plan combining the test system and the tested object BIT system is developed.Based on the ATML description methods,the test process,test steps and actions,equipment under test and other test resources are configured as files,and verify them standardization and effectiveness.Finally,based on the above research,an automatic test system is built and developed,and applies a certain type of electronic equipment test information model to the test system.The system can complete data communication,signal application and measurement,and complete test task output specification test result files.And it can be extended to the test of similar models by configuring different test files. |