Hardware Design And Implementation Of Multifunctional Analog Signal Test Module

With the rapid development of electronic measurement instruments,traditional large test systems typically consist of multiple single-function test instruments,but the drawbacks of slow data interaction,large size,lack of portability and flexibility are not suitable for rapid testing in the field and mobile testing.This paper addresses the problems of single function,large size,and inability to cover multiple test conditions and test environments of traditional electronic measuring instruments.This article locates the current market demand for electronic measuring instruments.Refer to the multi-functional miniaturized test module of the mainstream foreign models.A multifunctional analog signal test module with reconfigurable functions and configurable hardware has been designed.The module is a VXI single-slot C-size module with an 8-channel digitizer,an 8-channel frequency meter and an 8-channel arbitrary wave generator,all of which can be reconfigured.It not only solves the need for multi-functional joint testing,portable testing and fast mobile testing.In addition,the modular hardware configurable design concept greatly enhances the test range and test capability of electronic measuring instruments when multiple functional modules are hardware configured.The main areas of research in this paper include:1.According to the module functions and index requirements,the overall architecture of the multi-functional analog signal test module is designed to use the principle of miniaturization and low power consumption.2.The solution of the three function modules of digitizer,frequency meter and arbitrary wave generator is studied,and the hardware circuit design is carried out for each of the three functions.Finally,the design ideas based on functionally reconfigurable and hardware configurable are proposed,and the functionally reconfigurable and hardware configurable design is carried out for the multifunctional analog signal test module.3.Details of DDR3-based deep data storage logic implementation are studied.The implementation of a simple user logic interface for burst read and write operations on DDR3.DDR3-based real-time storage for high-speed data acquisition is designed.4.A high-resolution clock split-phase frequency measurement scheme is investigated,which implements 1ns resolution measurement of frequency,period and pulse parameters of the signal within the FPGA.5.A digital logic implementation scheme for arbitrary wave generators is studied.Direct frequency synthesis and digital modulation of external SSRAM memory are implemented within the FPGA.Through research on the above content.This paper designs an 8-channel multifunction analog signal test module with reconfigurable functions and configurable hardware.Three different measurement functions are implemented in a single module.It can be widely used in rapid test and mobile test under certain extremely complicated test conditions.It has laid a solid foundation for the multifunctional miniaturized integrated test system.