Research On Analysis And Verification Method In Test Process Of Crypto Chip

The crypto chip test, which is based on the basic parameters such as electrical parameters and physical properties, should test its cryptogram service function and performance. Facing various kinds of crypto chip, large quantity of test content and much differences of test process, With traditional method of constructing test system, which lead to hardly design test system and lower adaptation of test system. With the method of process management can improve the adaptation of test object, reduce the difficulty of system design and maintain cost.This thesis is aimed at the issues of standard description and well-structure analysis in test process of crypto chip test system based on process management, designs a test process description model of three-dimensional for crypto chip test system, proposes an liveness analysis method based on Petri net for test process and a verified method which is base on Self-contained tree.1. In order to support the standard specification of test process, this thesis designs a test process description model of three-dimensional for crypto chip test system. By analyzing the test process requirement of describing of cryptogram service function and performance in the crypto chip test system, combing the international standard-ATML, this thesis designs a three-dimensional test process description model which includes control process meta-model, test resource meta-model and data meta-model. Meanwhile its graphical representation of the three-dimensional model is given to support test process’ s visual definition and editing; giving the the XML describing of three-dimensional to support test process storing in test system.The application instances indicate that the three-dimensional description model can use to support the specific description of crypto chip of cryptogram service function and performance test process, support the design of test software and improving the flexible of test system.2. The well-structure of test process is the precondition of testing, but the liveness analysis of test process is the basis that guarantees well-structure of test process. In order to analyze the test process liveness, this thesis proposes a liveness analysis method based on Petri net for test process. This thesis gives a transformational rule from three-dimensional description model to Petri-net model and verifies the consistency of liveness between tested process before transition and tested process after transition. The Petri-net analysis technique is used to make a liveness analysis for the test process after transition and then achive analyzing liveness equally. The application instances indicate that this method provides an efficiency solution for the problem of analyzing liveness of the test process described by three-dimensional description model.3. The integration of or-split verification in test process is an important part that guarantees the well-structure of test process, this thesis proposes a verified method which is base on Self-contained tree. By giving a formalized definition of or-split’s integrity. The definition means to transform or-split’s judging condition sets into or-split’s matrix representation. By constructing a Self-contained tree by judged variable sets, cutting the tree by obeying some conditions, constructing Self-contained matrix, comparing or-split’s matrix to verify branch’s integrity. And we can judge whether exist redundance or-split or miss or-split.