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Development Of The Hardware Of Portable Universal Missile Test System

Posted on:2015-04-25Degree:MasterType:Thesis
Country:ChinaCandidate:C SunFull Text:PDF
GTID:2272330422990817Subject:Instrument Science and Technology
Abstract/Summary:PDF Full Text Request
The current instrument resources of missile Universal Automatic Test Systemare generally composed of a large number of different types of test instruments, andmust be used with one or more dedicated test interface adapter (ITA) to form acomplete test system. Increasing missile test models result in a huge volume of testsystems. In this thesis, a portable missile Universal Automatic Test System wasdesigned based on the core idea of improving the functionality and performance ofthe shared instrument resources, the breakthrough of the configurable ability of thetest terminals and the large range of input range, the technological means of thehigh-density integration, and the reliable guarantee of the protection for the input.The development of this system can reduce the volume of the missile test systemand have important significance of improving the versatility of the system.This system is based on the standard of PXI bus, and is consist of a small andportable case which including the input device, the display window, the computerwith PXI interface, the testing resources and the power supply for testing. Measuredobjects indifferent types can connect with the test system directly using thededicated test cables, and can control the system with a simple and effective systemaccess interface, without the recuperate and the allocation of ITA. The testingresources is consist of a relay module, a communication module and three analogtest modules. The relay module controls the power supply, and provides thecontact-on-off resources. The communication module provides the resource ofcommunication. And the analog test modules provide many resources of analogsignal’s measuring and resources of the output of excitation signal.Analog test module is the core resources of this system. This module isachieved with a DSP and a FPGA. The control of module functions and theinteracting with the data of upper computer are achieved in the high-speed DSP. Thelogic of hardware interface and the logic of auto controlling to all of the functionmodule is achieved in the FPGA. The hardware circuit of high-speed acquisition isdesigned by ADC, high-speed comparators, DAC and the circuit of signal’srecuperate. The circuit of low-speed acquisition and the circuit of current acquisitionis designed with the core of multimeter chip. The circuit of stimulus signal isdesigned with the core of ADC. To meet the system’s requirements, this module usesa wide-range technology, the technology of the terminal’s re-configure and thetechnology of overvoltage protection, so it layed the foundation for ITA’sdramatically streamlined and high-density integration.Finally, the system was tested. The result of testing shows that the system is designed properly, and the function can meet the functional and performanceindicators.
Keywords/Search Tags:Automatic test system, portable, missile tests, analog test
PDF Full Text Request
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